Ensure high-value DIC results every single time

Optical full-field measurement methods such as DIC (Digital Image Correlation) are highly dependent on the initial user input: subset, step, shape function and eventual strain smoothing. This puts the quality of DIC tests at risk, as they depend on correctly implemented user set-ups.

MatchID provides a Performance Analysis module that guides the user in making a very deliberate choice on user settings for both 2D and Stereo DIC.

  • Parallel processing generates metrological charts in the blink of an eye
  • Full-field displacement and strain maps at various settings can instantly be consulted
  • A quantitative approach similar to convergence analysis in FE computations

Get more out of metrology

Download your free demo or download datasheet (pdf)